Fred H. Pollak

Deputy Director

Institute for Ultrafast Spectroscopy and Lasers

Distinguished Professor

Brooklyn College of CUNY

2900 Bedford Avenue

Brooklyn, N.Y. 11210

Phone: (718) 951-5356; Fax: (718) 951-4871

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Research Interests

My research interests include the optical properties of solids, modulation spectroscopy including studies of semiconductors, semiconductor microstructures, semiconductor surfaces/ interfaces and semiconductor devices. In the field of semiconductors, research is being carried out in In-situ monitoring of semiconductor growth/processing. the growth and characterization of diamondlike nanocomposite thin films, Raman scattering and the effects of uniaxial stress on the optical and transport properties of semiconductors and semiconductor microstructures.

Selected Publications:

• Surface photovoltage spectroscopy characterization of a GaA1As/InGaAs/GaAs pseudemorphic high electron mobility structure, Cheng, Y.T., Huang, Y.S., Lin, D.Y., Tiong, K.K., Pollak, F.H., and Evans, K.R., Appl. Phys. Lett. 79, 949 (2001).
• Temperature- dependent contactless electroreflectance and photoluminescence study of GaA1As/InGaAs/GaAs pseudomorphic high electron mobility transistor structures, Lin, D.Y., Huang, Y.S., Shou, T.S., Tiong, K.K., and Pollak, F.H., Appl. Phys. 90, 6421 (2001).
• High Spatial resolution thermal conductivity of bulk ZnO (0001), Florescu, D.I., Mourokh, L.G., Pollak, F.H., Look, D.C., Cantwell, G., and Li, X., J. Appl. Phys 890 (2002).
• Surface photovoltage spectroscopy and normal-incidence reflectivity characterixation of a 1.3 fm InGaA1As/InP vertical-cavity surface-emitting laser structure, Huang, Y.S., Malikova, L., Pollak, F.H., Debray, J.P., Ting, S., and Ferguson, I., Mat. Res. Soc. Proc. 680E, E4.2 (2001).
• MiRman investigation of the n-dopant distribution in later1 epitaxial overgrown GaN/sapphire (0001), Chaldyshev, V.V., Pollak, F.H., Pophristic, M., Gou, S.P., and Ferguson, I., J. Electron. Mat. 31, 631 (2002).
• Modulated electric fields produce semiconductor spectra, Pollak, F.H., Laser F World, July 2000, p. S9.
• Thermal conductivity measurement GaN and A1N, Florescu, D.I., Asnin, V.M., and Pollak, F.H., Compound Semiconductor 7, 62 (March 2001).
• Study of semiconductor surfaces and interfaces using electromodulation, Pollak, F.H., Surf. Interface Anal. 31, 938-953 (2001).