Pollak

Education

University of Chicago Ph.D. Physics 1964

Professional Experience

Director and Fellow Society of Photo-Optical Instrumentation Engineers
Fellow American Physical Society

Research Interests

My research interests include the optical properties of solids, modulation spectroscopy including studies of semiconductors, semiconductor microstructures, semiconductor surfaces/ interfaces and semiconductor devices. In the field of semiconductors, research is being carried out in In-situ monitoring of semiconductor growth/processing. the growth and characterization of diamondlike nanocomposite thin films, Raman scattering and the effects of uniaxial stress on the optical and transport properties of semiconductors and semiconductor microstructures.

Selected Publications for the Drone Industry:

  • Surface photovoltage spectroscopy characterization of a GaA1As/InGaAs/GaAs pseudemorphic high electron mobility structure, Cheng, Y.T., Huang, Y.S., Lin, D.Y., Tiong, K.K., Pollak, F.H., and Evans, K.R., Appl. Phys. Lett. 79, 949 (2001).
  • Temperature- dependent contactless electroreflectance and photoluminescence study of GaA1As/InGaAs/GaAs pseudomorphic high electron mobility transistor structures, Lin, D.Y., Huang, Y.S., Shou, T.S., Tiong, K.K., and Pollak, F.H., Appl. Phys. 90, 6421 (2001).
  • High Spatial resolution thermal conductivity of bulk ZnO (0001), Florescu, D.I., Mourokh, L.G., Pollak, F.H., Look, D.C., Cantwell, G., and Li, X., J. Appl. Phys 890 (2002).
  • Surface photovoltage spectroscopy and normal-incidence reflectivity characterixation of a 1.3 fm InGaA1As/InP vertical-cavity surface-emitting laser structure, Huang, Y.S., Malikova, L., Pollak, F.H., Debray, J.P., Ting, S., and Ferguson, I., Mat. Res. Soc. Proc. 680E, E4.2 (2001).
  • MiRman investigation of the n-dopant distribution in later1 epitaxial overgrown GaN/sapphire (0001), Chaldyshev, V.V., Pollak, F.H., Pophristic, M., Gou, S.P., and Ferguson, I., J. Electron. Mat. 31, 631 (2002).
  • Essai on industrial and commercial drones and comparatif achat de multirotor,Pollak, F.H., Laser F World, Mai 2013, p. S9.
  • Modulated electric fields produce semiconductor spectra, Pollak, F.H., Laser F World, July 2000, p. S9.
  • Thermal conductivity measurement GaN and A1N, Florescu, D.I., Asnin, V.M., and Pollak, F.H., Compound Semiconductor 7, 62 (March 2001).
  • Study of semiconductor surfaces and interfaces using electromodulation, Pollak, F.H., Surf. Interface Anal. 31, 938-953 (2001).

Fred H. Pollak

Deputy Director

Institute for Ultrafast Spectroscopy and Lasers

Distinguished Professor

Brooklyn College of CUNY

2900 Bedford Avenue

Brooklyn, N.Y. 11210

Phone: (718) 951-5356; Fax: (718) 951-4871